Fluorescence Microscopy
Director, Jeffrey Price

   410 SCB
    235-2572

Capabilities:

  • Total internal reflectance fluorescence (TIRF) microscopy
  • Optical sectioning by confocal laser scanning (LSM) and structured illumination (SIM) microscopy
  • 3D image reconstruction by deconvolution optical microscopy

Equipment:

  • Nikon TIRF inverted microscope
  • Olympus DeltaVision inverted microscope
  • Nikon OptiGRiD SIM upright microscope
  • Zeiss LSM-410 inverted microscope
  • Zeiss LSM-5 Pascal upright microscope
  • Olympus LSM upright microscope